IEC jointed finger probe B

Brand:CX

Description:IEC61032 Test probe B, jointed finger probe This Test Probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

Origin:China Guangdong

Model:CX-2B

MOQ:1PCSUnit/Units

Port:Shenzhen

Payment Terms:T/T

Supply Ablility:1000

Supply Time:Day

Delivery Time:2020-06-17

Packaging Details:standard packing, each in a silver box

Product detail:

  IEC61032 Test probe B, jointed finger probe

Conforms to:

 This is the "international" test probe B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

 Notes:
Both joints shall permit movement in the same plane and the same direction through an angle of 90^o with a 0^o to +10^o tolerance.

 

Technical Parameters:

Kunrled finger diameter	12mm
Knurled Finger length	80mm
Baffle plate diameter	50mm
Baffle plate length	100mm
Baffle thickness	20mm